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Services and RD integration

Provide quartz and other substrate wafer reclaim, optical verniers, probe-card test wafer and so on

Qz、Si and glass reclaim

  1. thickness measurement and films removal
  2. scratch and pit screening
  3. grinding or wet etching
  4. Polishing, clean/inspection

Probe card test wafers

  1. 8" wafer resist patterning

  2. Cu/Ni/Sn plating

  3. Resist stripping

Patterned Optics

  1. Reticle and patterned lens
  2. Image test and evaluation mask
  3. Optical Scale for Image

Research an development items

  1. LW IR Si window lens